Technical Description
A wavefront measuring system with enhanced dynamic range in the valuation of large or strong curvature in the wave-front by using sequence of binary patterns presented on a light modulator and a combination of half wave plate, light modulator and polarizer.
Problems Addressed
- Complex Systems
- Lack Robustness
- Less Accurate
Tech Features
- Simple
- Increased Dynamic Range
- High Accuracy
- Real Time Adjustable Light
- Transmittance or Reflectance
Target Audience
- Semiconductor Industry
- Free-Space Optical Communication Industry
- Microscopy and Endoscopy Centres
- Consumer Electronic Devices
- IT and Telecommunication Industry
- Aerospace and Defence Sector
- Biomedical Devices Industry
Tech ID: P18-1062 TRL 2 Patent Status: FER Issued Available For Exclusive and Non-exclusive License
