High Temperature Avalanche Photo Diode

Technical Description

This invention relates to a high -operating temperature avalanche photodiode (APD) designed for efficient detection of low photon flux in near infrared and infrared wavelengths. It integrates a photonic crystal slabs (PCS) structure with ultra-thin silicon or InGaAs absorber layers to achieve high absorption efficiency and minimal dark current at room temperature.

Problems Addressed

  • Lacks Low-Dark Current Performance
  • Inefficient Photon Absorption
  • High Thermal Noise Interference
  • Complex Semiconductor Layering
  • Limited Broadband Response
  • Poor Spectral Selectivity

Tech Features

  • Enhanced Photon Absorption
  • Efficient Dark Current Reduction
  • Improved Broadband Response
  • Optimized Optical Resonance
  • Compact Pixel Architecture
  • Better Thermal Stability

Target Audience

  • Quantum Imaging Technology Companies
  • Lidar & Remote Sensing Manufacturers
  • Optical Communication & Photonics Industries
  • Semiconductor Device & Sensor Manufacturers
  • Research & Development
Tech ID: P16-1705 TRL 4 Patent Status: Published Available For Exclusive and Non-exclusive License
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P16-1705

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Contact For Licensing

Lalit Ambastha

+91- 9811367838

Dr. Medha Kaushik

+91- 6359777555

tech@ipbazzaar.com

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