Nano-Thickness Measurement Device

Technical Description

This invention relates to an optical device and method for in situ sub-nanometers thickness and inter-diffusive measurement using etched fiber Bragg Grating Sensors.

Problems Addressed

  • Lacks Precision
  • Inefficient Scaling
  • Limited Sensitivity
  • Destructive Methods
  • Unreliable Accuracy

Tech Features

  • Efficient Sub Nanometer Detection
  • Enhanced Sensitivity Sensors
  • Better Inter Diffusion Analysis
  • Improved Film Monitoring
  • Real-time Measurement

Target Audience

  • Semiconductor Fabrication & Nanomanufacturing Industries
  • Healthcare Diagnostics & Medical Device Companies
  • Advanced Material Science & Polymer Industries
  • Optical Sensor & Photonics Technology Companies
  • Research & Development
Tech ID: P13-1648 TRL 4 Patent Status: Published Available For Exclusive and Non-exclusive License
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P13-1648

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Contact For Licensing

Lalit Ambastha

+91- 9811367838

Dr. Medha Kaushik

+91- 6359777555

tech@ipbazzaar.com

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