Simulation-Assisted NDE

Technical Description

This technology is a method and system for enhancing anomaly detection in non-destructive evaluation (NDE) using simulation-assisted data generation and deep learning models.

Problems Addressed

  • Lacks Training Data
  • Inefficient Detection
  • Limited Automation
  • Incomplete Coverage
  • Restricted Adaptation
  • Insufficient Accuracy

Tech Features

  • Efficient Anomaly Detection
  • Enhanced Automation
  • Better Datasets
  • Efficient Deep Learning
  • Enhanced Accuracy
  • Better Evaluation

Target Audience

  • Aerospace & Defense Inspection Industries
  • Automotive & Transport Manufacturing
  • Healthcare & Medical Device Evaluation
  • Research & Development
Tech ID: P14-1559 TRL 5 Patent Status: Granted Available For Exclusive and Non-exclusive License
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P14-1559

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Contact For Licensing

Lalit Ambastha

+91- 9811367838

Dr. Medha Kaushik

+91- 6359777555

tech@ipbazzaar.com

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