Technical Description
This invention introduces non-destructive testing add-on uses a ribbed bar waveguide array to transfer a precise spatial pattern into specimens, selectively imposing a specific guided wave mode. This cost-effective, flexible device simplifies data measurement and eliminates intensive post-processing by generating a specific guide wave mode at a particular frequency in the specimen or object being tested.
Problems Addressed
- Bulky Equipment
- High-Cost Systems
- Intensive post-processing
- Poor Wave Mode Precision
- Conformity to various shapes and sizes
Tech Features
- High-Precision Modal Selectivity and Control
- Inspect on Both Flat and Curved Surfaces
- Built-In Speed Correction Factor
- Custom Wavelength Matching
- Innovative Ribbed Bar Add-On Design
- Fast and Low-Cost Sub-Assembly Fabrication
- Requires Only One Excitation Element
Target Audience
- Energy Infrastructure
- Civil Infrastructure and Construction
- Aerospace and Defense Manufacturing
- Maritime, Naval, and Subsea Engineering
- Rail Transportation & Infrastructure Sector
- Medical Diagnostics & Orthopaedics Industry
- Power Generation (Nuclear, Thermal, and Wind)
Tech ID: P38-2043 TRL 4 Patent Status: Published Available For Exclusive and Non-exclusive License
