Technical Description
The invention introduces a method to assess beam width of reflectance curve dips in Surface Plasmon Resonance (SPR) sensors applicable to various dips and beam width determinations.
Problems Addressed
- Complex Resonance Selection
- Large Layer Thickness
- Resonance Shifting
- Multiple Resonance Effects
Tech Features
- Normalized Resonance Dips
- Highly Effective
- High Intensity Disparity
- Multiple Dips Capability
Target Audience
- Biomedical Sector
- Pharmaceutical Industry
- Environmental Monitoring
- Food Regulatory Authority
Tech ID: P13-2111 TRL 5 Patent Status: Granted Available For Exclusive and Non-exclusive License
